Systems and methods for bubble based ion sources

ABSTRACT

The present disclosure describes embodiments directed to a bubble based ion source system comprising an ion source configured to generate a plurality of ions, an ion channel, an electrode, and/or any other components. The ion source can include a container at least partially comprising a solvent or solution, a bubble generator coupled to the container configured to generate a plurality of bubbles within the solvent, and/or any other component. The ion channel can receive ions that are generated based on solvent from the bubbles.

CROSS-REFERENCE TO RELATED APPLICATIONS

This application is a continuation of, claims the benefit of, andpriority to U.S. patent application Ser. No. 15/147,204, entitled“SYSTEMS AND METHODS FOR BUBBLE BASED ION SOURCES,” filed on May 5,2016, and claims priority to, and the benefit of U.S. provisionalapplication entitled “SYSTEMS AND METHODS FOR BUBBLE BASED ION SOURCES”having Ser. No. 62/156,963, filed May 5, 2015 which are herebyincorporated by reference in their entireties.

BACKGROUND

Certain traditional methods and systems directed to ion generation caninvolve the application of high voltage at a low current. For example,electrospray ionization can involve applying a high voltage on a flow ofliquid that is directed to a small opening in a vacuum system, wheredroplets are de-solvated such that ions are ejected from the dropletsand accelerated into a mass analyzer. However, the use of anelectrospray for ionization can be limited in that a high voltage isnecessary. Moreover, the current capacity can also be limited due to thelimited throughput available from the flow of the liquid through theelectrospray.

BRIEF DESCRIPTION OF THE DRAWINGS

Many aspects of the present disclosure can be better understood withreference to the following drawings. The components in the drawings arenot necessarily to scale, emphasis instead being placed upon clearlyillustrating the principles of the present disclosure. Moreover, in thedrawings, like reference numerals designate corresponding partsthroughout the several views.

FIGS. 1 and 2 are drawings of examples of a bubble based ion sourcesystem.

FIGS. 3, 4A, and 4B are diagrams illustrating examples of applicationsof a bubble based ion source system.

FIG. 5 is a diagram illustrating an example principle involved in thebubble based ion source system.

FIGS. 6A-6C and 7A-7D are graphs describing examples of variablesrelated to a bubble size used in the bubble based ion source system.

FIGS. 8A-8D are graphs illustrating an example trajectory of a bubbleused in the bubble based ion source system.

FIGS. 9A and 9B are drawings illustrating an example of a multi-planeion trap array of the bubble based ion source system.

FIG. 10A is an example schematic drawing of the multi-plane ion traparray of FIGS. 9A and 9B.

FIG. 10B is a drawing illustrating the electric fields in each channelof an example of the multi-plane ion trap array of FIGS. 9A, 9B, and10A.

FIGS. 11A-11C are diagrams illustrating an example of a button electrodelevitation chamber of the bubble based ion source system.

FIGS. 12A and 12B are drawings and photos illustrating the use of microion-optical systems technology in the bubble based ion source system.

FIG. 13 is an example schematic of a vertically oriented atmosphericpressure ion sampling ion channel, ion source, and associated electrode.

FIG. 14 is an example schematic of one embodiment of the bubble basedion source system.

The drawings illustrate only example embodiments and are therefore notto be considered limiting of the scope described herein, as otherequally effective embodiments are within the scope and spirit of thisdisclosure. The elements and features shown in the drawings are notnecessarily drawn to scale, emphasis instead being placed upon clearlyillustrating the principles of the embodiments. Additionally, certaindimensions may be exaggerated to help visually convey certainprinciples. In the drawings, similar reference numerals between figuresdesignate like or corresponding, but not necessarily the same, elements.

DETAILED DESCRIPTION

In the following paragraphs, the embodiments are described in furtherdetail by way of example with reference to the attached drawings. In thedescription, well known components, methods, and/or processingtechniques are omitted or briefly described so as not to obscure theembodiments. As used herein, the “present invention” refers to any oneof the embodiments of the invention described herein and anyequivalents. Furthermore, reference to various feature(s) of the“present invention” is not to suggest that all embodiments must includethe referenced feature(s).

The embodiments described herein are not limited in application to thedetails set forth in the following description or illustrated in thedrawings. The invention is capable of other embodiments and of beingpracticed or carried out in various ways. Also, the phraseology andterminology used herein is for the purpose of description and should notbe regarded as limiting. The use of “including,” “comprising,” or“having” and variations thereof herein is meant to encompass the itemslisted thereafter, additional items, and equivalents thereof. The terms“connected” and “coupled” are used broadly and encompass both direct andindirect connections and couplings. In addition, the terms “connected”and “coupled” are not limited to electrical, physical, or mechanicalconnections or couplings. Common numerals in figures represent the sameor a similar element and further descriptions may be omitted.

The present disclosure describes embodiments directed to a bubble basedion source system including an ion source configured to generate aplurality of ions, a heat source positioned above the container, an ionchannel comprising an aperture and a plurality of electrodes. The ionsource further comprises a container at least partially comprising asolvent or solution, a bubble generator coupled to the containerconfigured to generate a plurality of bubbles within the solvent. Theheat source can be configured to evaporate at least a portion of thesolvent from each of the bubbles leaving a plurality of ions. The ionchannel can be configured to receive the ions through the aperture. Theelectrodes of the ion channel can also be configured to facilitateguiding the ion to an analyzer.

In one embodiment, the heat source can comprise at least one of anelectrode, an infrared ray, or an infrared projection. In someembodiments, the bubble generator can be configured to inject air intothe solvent to generate bubbles. In this regard, the bubble generatorcan comprise a tube structure to facilitate the passage of air into thesolvent to generate the bubbles.

In one embodiment, the bubble based ion source system can comprise anelectrode coupled to the ion channel to apply a voltage to the ionchannel. In some embodiments, the ion channel can comprise a pluralityof layers. Each layer can be applied a differed voltage depending on theconfiguration of the chamber and a desired field strength. The analyzerdevice can be at least one of an ion mobility spectrometer, a massspectrometer, a charged particle deposition system, or a charge energygeneration device

In particular, the component parts of the bubble based ion source systemcan be at atmosphere and therefore the method of applying the bubblebased ion source system can also be performed at atmosphere. In thisregard, a method of generating ions using the bubble based ion sourcesystem can comprise generating a plurality of bubbles in a solvent, thebubbles rising to a surface of the solvent, evaporating at least aportion of the solvent from each of the bubbles via a heat sourceleaving a plurality of ions through an aperture of an ion channel, andapplying a voltage to the ion channel to guide the ions to an analyzer,the voltage based at least in part on a configuration of the ion channeland a desired field strength, the ion channel comprising a plurality oflayers.

In some embodiments, the bubble based ion source system can provide forlow voltage and efficient ion generation and transportation to ionmobility spectrometers (MS), mass spectrometers (MS) analytical devices,charged particle deposition systems, and charge energy generationdevices. The bursting of bubbles on a surface of water and the naturalatomization process that occurs with that bursting can be a source ofions from a low voltage environment and at a high capacity over largeareas.

Ion mobility mass spectrometry is an analytical chemistry technique foraccurate determination of molecular weights, identification of chemicalstructures, and determination of the composition of mixtures andquantitative elemental analysis. In particular, MS can accuratelydetermine the weights of molecules and determine the structure ofmolecules based on fragmentation patterns of the ions that are formedwhen the molecule is ionized.

Ion source based systems can comprise a sample introduction, a compoundionization, and any other necessary phases. The ion source based systemscan utilize the bubble bursting ion source systems and methods disclosedherein. Molecule analytical systems can further comprise phases such asion mobility separation, mass separation, and ion detection. The presentdisclosure describes embodiments related to the natural atomizationprocess from bursting bubbles that generate ions which can be carried toion based analytical, deposition, and/or charging systems.

With reference to FIG. 1, shown is a bubble based ion source system 100for the measurement of electric charges on jet drops. The bubble basedion source system can include bubble generators 103, gas bubbles 106, asolution surface 109, and a chamber 112.

The gas bubble 106 can breach the solution surface 109 of the solution.The gas bubble 106 can burst when the gas bubble 106 breaches thesolution surface 109. The bursting of the gas bubble 106 can generates aforce that causes ripples 115 on the solution surface 109. The forcefrom the gas bubble 106 bursting can also generate a jet drop 118.

The chamber 112 can include a heat source 121, an aperture 124 in afirst plate 127, and a second plate 130. In some embodiments, the heatsource 121 is omitted. The jet drops 118 can pass through one or moreapertures 124 to enter the chamber 112. In one embodiment, the aperture124 is a circular hole in the first plate 127 of the chamber 112. Insome embodiments, multiple apertures 124 are positioned in a path ofmultiple bubble generators 103. The bubble generators 103 can be placedin an array to generate a larger volume of jet drops 118.

The aperture 124 can be in the form of other shape, such as ellipses, anelongated slit, rectangle, or other shapes. The chamber 112 can bepositioned such that the aperture 124 is perpendicular to a path of thejet drop 118, such that the jet drop 118 can pass through the aperture124.

The heat source 121 can be an infrared heating element configured togenerate infrared heat. The heat source 121 can be an electrode, aninfrared ray, an infrared projection, or another heat source. The jetdrop 118 can enter the chamber 112 as a droplet, for example, a fullvolume liquid or bubble with a gas interior and liquid surrounding thegas. The heat source 121 can modulate the jet drop 118 and cause theliquid to evaporate to reduce the size of the jet drop 118. As anexample, the jet drop 118 can be reduced by the heat source to largeparticles in the range of 100 microns to 100 millimeters, smallparticles in the range of 10 microns to less than 100 microns, and tocharged molecules that are a nanometer or less in size.

The jet drop 118 can be transported at various sizes based on differentembodiments of the present disclosure. In different embodiments, the jetdrop 118 can be transported at a size of one or more of a droplet, largeparticles, small particles, charged molecules, or other sizes. The heatsource 121 can supply the infrared heat to an interior of the chamber112 to reduce the size of the jet drop 118. The heat source 121 can bepositioned at an opposite side of the chamber 112 in comparison to theside of the chamber 112 containing the aperture 124. For example, theheat source 121 can be located on an upper side of the chamber 112relative to a vertical z-axis.

The plates 127 and 130 can act as separator. In some embodiments, theplates 127 and 130 also act as an ion trap. In other embodiments,another pair of parallel plates act as an ion trap to transport theparticle. The plates 127 and 130 can be substantially parallel to eachother. The first plate 127 and the second plate 130 can have a highpotential difference between each other. As an example, a positiveterminal of a power source can be coupled to the first plate 127 and anegative terminal of the power source can be coupled to the second plate130 to create the potential difference between the two plates 127 and130. The high potential difference can create an electric field betweenthe two plates 127 and 130. The jet drop 118 can be stabilized orlevitated by the electric field between the two plates 127 and 130.

Once ionization has occurred, the ions can be transported and/orprocessed. For example, the bubble based ion source system 100 caninclude a spectrometer that receives the ions from the chamber 112. Theions can also be received by an ion trap. The trapped ions can betransported using a variety of transport mechanisms described herein.The trapped ions can be transported to a spectrometer for analysis. Thetrapped ions can also be transported for printing or processing inanother way.

In one embodiment, the bubble based ion source system 100 is used with abeaker or vessel of a solution containing an analyte. In someembodiments, the bubble based ion source system 100 is used over a bodyof water, and the solution surface 109 is the surface of the body ofwater. The body of water can be a lake, an ocean, or another body ofwater. The bubble based ion source system 100 can be used to extractions from the solution and move those ions, for example, the ions can bemoved into a spectrometer.

With reference to FIG. 2, shown is a bubble based ion source system 100b for the measurement of electric charges on jet drops. The bubble basedion source system 100 b can include a supporting structure 203 and avessel 206. The supporting structure 203 can include one or moreadjustment knobs 209, 212, 215, and 218 and a stand 221. The supportingstructure 203 can be configured to swivel such that an aperture 124 inthe bottom chamber 112 can be lined up with the path of jet drops 118that are expelled from the solution. The supporting structure can alsobe affixed in place by tightening adjustment knobs 209, 212, 215, and218.

The vessel 206 can provide store the liquid within a hollow space of thevessel 206. A test solution can be added to the vessel, for example, ananalyte. Gas bubbles 106 can be generated in the test solution to formjet drops 118. The jet drops 118 can be separated and ionized by thebubble based ion source system 100 b. In some embodiments, the vessel206 contains a buffer solution in addition to the test solution. Thetest solution can be floated on top of the buffer solution. The buffersolution can be water or another solution that does not interfere withthe test solution. In some embodiments, the buffer solution has a lowerdensity than the test solution to allow the test solution to float ontop of the buffer solution.

An adjustment knob 209 can include a locking component and a rotationalcomponent. As an example, when the locking component of the adjustmentknob 209 is in an unlocked position, the adjustment knob 209 can turnthe upper plate that contains the heat source 121. The adjustment knob209 can be restricted from turning when a locking component is in alocked position.

The heat source 121 can be affixed to the upper plate, such that turningthe adjustment knob 209 turns the heat source 121. The heat source 121can emit heat in a direction perpendicular to the upper plate. In someembodiments, the heat source 121 is separate from the upper plate, andturning the adjustment knob 209 does not change the direction of outputof the heat source 121.

The adjustment knob 212 can raise and lower the second plate 130relative to the chamber 112. The distance between the first plate 127and the second plate 130 can be adjusted using the adjustment knob 212.In some embodiments, turning the adjustment knob 212 can require a userto overcome a resistance of the adjustment knob 212. The resistance canprevent the adjustment knob 212 moving when not in use. In otherembodiments, the adjustment knob 212 includes a locking componentsimilar to the adjustment knob 209 that prevents turning of theadjustment knob 212 when in a locked position.

The adjustment knob 215 can lock an arm of the stand 221. When theadjustment knob 215 is in an unlocked position, the arm can swivelaround on the stand 221. When unlocked, the arm can also be raised andlowered on the stand 221. The adjustment knob 215 can have a threadedshaft that inserts into a threaded hole of the stand 221. Turning theadjustment knob 215 can cause the threaded shaft to contact the stand221 to hold the arm in place.

With reference to FIG. 3, shown is a diagram 300 illustrating an exampleof an application of a bubble based ion source system 100 according tovarious embodiments of the present disclosure. In particular, FIG. 3illustrates a concept for ion sourcing via the bursting of bubbles forion mobility or MS, for example.

At box 303, an analyte is within a solution. The analyte can preexist inthe solution or can be added to the solution for the purpose of testing.As an example, the diagram 300 can illustrate the process for testing ananalyte within a lake or ocean. The analyte can be naturally distributedwithin the solution.

At box 306, a bubble generator 103 can generate a gas bubble 106 withinthe solution. The analyte can attach to the surface of the gas bubble106. As an example, as the gas bubble 106 can be propelled through thesolution based on a disparity in the density of the gas bubble 106 incontrast to the solution. The gas bubble 106 can pass by the analyte inthe solution. The analyte in the solution that encounters the gas bubble106 can attach to the surface of the gas bubble 106. Multiple gasbubbles 106 can be generated in sequence. Further, multiple bubblegenerators 103 can be placed in an array to increase the number of jetdrops 118 that are generated for subsequent use.

At box 309, the gas bubble 106 can breach the solution surface 109 ofthe sample. The gas bubble 106 can generate a force upon breaching thesolution surface 109 and expel a jet drop 118. The jet drop 118 caninclude the analyte that attached to the gas bubble 106 in box 306. Thejet drop 118 can also include gas from the gas bubble.

At element 312, the jet drop 118 can be collected and the analyte can beionized. The jet drop 118 can enter the chamber 112 through an aperture124. The chamber 112 can collect the jet drop 118 and ionize theanalyte. In one embodiment, the analyte is ionized by the electric fieldcreated between the first plate 127 and a second plate 130. In anotherembodiment, the analyte is suspended by an electric field and ionized bya heat source 121.

At element 315, the mass of the ion can be selected. The mass selectioncan be performed by an ion trap. The mass selection can also beperformed by a mass analyzer. The mass analyzer can be a quadrupole massanalyzer, a time of flight mass analyzer, a magnetic sector massanalyzer, an electrostatic sector mass analyzer, a quadrupole ion trapmass analyzer, an ion cyclotron resonance, or another mass analyzer. Themass of the ionized analyte can be selected by moving the ionizedanalyte in a desired direction for processing.

At box 318, the selected mass is detected. For example the mass can bemoved into a sensing area of a spectrometer. The spectrometer can detectthe ionized analyte in the selected mass.

Similarly, in an analytical system example, FIGS. 4A and 4B describe theevolution of an analyte from solution to the atmosphere by absorption ofat least a portion of the bubbles or the solution. When the bubblebursts, an ionized analyte can be released at the liquid/gas interfacein the presence of an electric field.

Jet drops ejected from a solution by an air bubble that bursts at thesurface of water can be stabilized or levitated by creating an electricfield between two parallel plates with a high potential difference. Inthis regard, the gravitational force pulling the jet drop down will bebalanced by the electric field pulling the opposite direction.

At box 403, a sample can be introduced into the solution. The sample caninclude the analyte. In one embodiment, the sample is the analyte. Thesample can be poured into a vessel 206. In some embodiments, the sampleis already within a solution.

At box 406, a bubble generator 103 can generate a gas bubble 106 withinthe solution. The bubble generator 103 can generate multiple gas bubbles106 one after the other with a delay in time between each bubble.

At box 409, an electric field separates and ionizes the analyte. As anexample, the pair of plates 127 and 130 can generate an electric fieldby having a large potential difference between them.

At box 412, the electric field or a gas flow can transport the analytefor analysis. In one embodiment, a gas is released within chamber 112 topropel the ionized analyte in a predetermined direction. The ionizedanalyte can be propelled into a mass spectrometer.

At box 415, a mass spectrometer can print the ionized analyte. As anexample, the ionized analyte can be applied onto a substrate anddeposited onto the substrate. The ionized analyte can be used forplating deposition.

With reference to FIG. 5, shown is a schematic diagram of a device 500that illustrates an example of the principle that an electric forcebeing applied upward on a charged drop can balance the force of gravitythat applies downwards, such that the drop remains stationary betweenthe two parallel plates 127 and 130. Evaporative loss, however, cancause the drop to rise through the field and deposit itself on thesecond plate 130. The evaporative loss can also facilitate the transportof both ions and charged droplets in the field and facilitate thetransport/drift of ions into a separate analyzer, print region, orcharge collection region.

A device 500 capable of generating an appropriate amount of ionizedmaterial for analysis in MS via bubble bursting can be dictated by theabilities and limits of a channel that captures and transports the ions.The levitation of an ion using two parallel plates 127 and 130 can allowthe jet drop to a hold position while evaporation enables atomization ofthe ions trapped within the levitating drop.

With reference to FIGS. 6A, 6B, and 6C, shown are graphs describingexamples of variables related to a bubble size used in the bubble basedion source system 100. In particular, FIG. 6A shows a graph illustratingthe relationship between bubble size of a gas bubble 106 and theejection height, or the height to which the top jet drop 118 is ejectedfrom bubbles bursting in a solution. Similarly, FIGS. 6B and 6C aregraphs illustrating the relationship between bubble size of a gas bubble106 and that of the top jet drop 118 from gas bubbles 106 bursting atseawater at temperatures of about 4° C. and 22°−26° C.

In addition, FIGS. 7A-7D are graphs describing examples of variablesrelated to a bubble size used in the bubble based ion source system 100.Specifically, FIGS. 7A-7D are graphs illustrating terminal rise velocityversus gas bubble 106 diameter for air, Nitrogen, Helium, and CarbonDioxide bubbles in water, respectively. The solid lines representStokes' terminal velocity prediction, and the broken lines representHadamard-Rybczynski terminal velocity predictions. Therefore, the graphsshown in FIGS. 7A-7D show comparisons in terminal velocity predictions.

With accompanying control in ion mobility, a sequence of jet drops 118and associated ions can be collected and transported to detection,deposition, or charge capture devices. At atmospheric pressure,horizontal drift from ambient circulation can be likely to deflect ionsfrom the target. As such, enclosing and minimizing the space around theionization source and chamber 112 can reduce ion loss. Alternatively, acontrolled laminar flow of gas can be utilized to assist evaporationrates and transport to the final device using the ions. Either method ofenvironmental control can use a precise and reproducible formation ofjet drops 118 and ejection heights. Otherwise, ion loss to the enclosureboundaries can result. Manipulation of the electric field can occur bycontrolling the potential energy and the distance between the two plates127 and 130 both statically and dynamically, using both analog anddigital control waveforms and techniques.

With reference to FIGS. 8A-8D, shown are graphs illustrating an exampletrajectory of a bubble used in the bubble based ion source system 100.In particular, the graphs shown in FIGS. 8A-8D are graphs describingexample trajectories of a gas bubble 106 having about a 1.12 mm radius(at about 1 atm). FIG. 8A shows a vertical z component of velocity asmeasured with an ultrasound technique. FIG. 8B shows a y position of thegas bubble 106 from camera data, and FIG. 8C shows an x position of thegas bubble 106 from camera data. FIG. 8D shows a three-dimensionreconstruction of a full trajectory of the gas bubble 106. In anembodiment, the gas bubble 106 can begin to rise straight, followed by azigzag motion in various planes with oscillating velocity, and followedby a three-dimensional spiral motion with a steady velocity, as shown inFIG. 8D.

Density and viscosity can affect the ability of a jet drop 118 to belevitated, as does the column height of the sample chamber 112, asdescribed above. Trends in the diameter of the rising gas bubble 106indicate that larger gas bubbles 106 have a greater rising velocity andcan therefore be susceptible to a spiraling trajectory and greater jetdrop 118 in height, size, and less precision for the location of the jetdrop 118. Ionization of a larger jet drop 118 can require a longersuspension period in the ionization chamber 112 with a greater electricfield between plates 127 and 130 for gravitational balance or additionalheating from heat source 121. In one embodiment, the gas bubbles 106 arerelatively smaller such that the gas bubbles 106 can rise through asample column less than about 20 cm. In this regard, the gas bubblebased ion source can be structured accordingly and accommodate a higherand continuous throughput. The sample column can be structured to betall enough to allow the gas bubble 106 to scrub sufficient analyte asit rises, but small enough to allow quick flushing and rinsing of thecolumn with clean solvent between samples.

In one embodiment, the bubble ion source can be made at least partiallywith Printed Circuit Board (PCB) materials and constructions. The use ofPCB based MEMS (PCBMEMS) systems for the creation of fluid transportsystems and ion optical systems is provided in U.S. Pat. No. 7,425,276(“Method for etching microchannel networks within liquid crystal polymersubstrates”), which is hereby incorporated by reference in its entirety.

Parallel plate ion chambers can be used for observation ofmicro-particles by restricting their movements within electric fields.Certain devices can be capable of restricting movement of a 11 μmparticle to within 1 μm by applying a 1.2 kV ac to middle electrodes and7 V dc to the lower plate to counter the effects of gravity and strayelectric fields. Keeping the particle stable is essential to makingmeasurements optically or by any other method of observation. However,some embodiments of the ion source comprising an ion trap can allow forthe transport of ions from the electric field into any separateoperational space. In some embodiments, the multi-plane approach atestablishing a trap does not allow for locomotion of the particle.

With reference to FIGS. 9A and 9B, shown are drawings illustrating anexample of a multi-plane ion channel 900 of the bubble based ion sourcesystem 100. In particular, FIG. 9A is a drawing showing one embodimentof the trap channel, also referred to herein as an ion channel or an iontunnel that comprises a pair of printed circuit board plates (PCB), apair of end cap electrodes, and a pair of boundary electrodes. In oneembodiment, the end cap electrodes and the boundary electrodes are madeof stainless steel. In one example, a jet drop 118 can be levitated andionized between plates 127 and 130 and then transported to themulti-plane ion channel 900 for further transport and/or processing.FIG. 9B is a drawing showing one embodiment of the trap array comprisingan Ion Trap Array (ITA) mass analyzer with four channels that can beassembled using three pairs of electrodes. The multi-plane ion channel900 is one example of a structure that can be used for transporting thevolume downstream.

The ion array can comprise strips of conductive material on parallelprinted circuit boards for dynamic control of the electric field and canprove useful to transport generated ions from bubble-bursting source.Dynamic control offered by the printed circuit board design offers canfacilitate setting the strength of the electric field. In oneembodiment, as users of the bubble-bursting ion source choose to usesolvents whose charge to mass ratio and ejection heights as jet dropsdiffer from distilled or saline water. In this case, the use of printedcircuit board can enable miniaturization and mobility for future designsonce the basic configuration has been established.

With reference to FIG. 10A, shown is a schematic drawing 1000 of anexample embodiment multi-plane ion trap array, such as the multi-planeion channel 900 of FIGS. 9A and 9B. In particular, FIG. 10A shows aschematic representation of the ion trap array which can allowlongitudinal step-wise translation in the horizontal (x) direction. FIG.10A shows the connection of a power supply 1003 where signals applied tothe adjacent electrodes can have the same potential but oppositepolarity. The AC waveforms can be coupled to the RF signal or digitaltrapping waveform via transformers 1006. The dashed lines shown in FIG.10A are fields that can keep constant while operating each separate ITAchannel.

In this regard, FIG. 10B is a drawing 1001 illustrating the electricfields in each channel of an example of the multi-plane ion trap arrayof FIGS. 9A, 9B, and 10A. Specifically, FIG. 10B shows electric fieldsin a first channel 1009 a, a second channel 1009 b, a third channel 1009c, and a fourth channel 1009 d of the ITA. In one embodiment, thedimensions of each channel of the ITA is about x=5.5 mm and about y=6.25mm. Each of the channels 1009 a-d is an ion trap, where the ion can betrapped in a center of each channel 1009 a-d. The channels 1009 a-d canmodulate ions and get a mass spectrum from the ions. In someembodiments, a button electrode levitation chamber (BEL) can for thelevitation of a charged particle below the level of the truncated,vertically oriented quadrupoles yet laterally centered among the poles.

With reference to FIG. 11A, shown is an example schematic 1100 thatdepicts a standard quadrupole electrode that levitates particles 1103between the four pole electrodes 1106, 1109, 1112, and 1115. FIG. 11Bshows an example schematic that depicts the BEL design in which theparticle 1103 levitates below the shortened button electrodes 1118,1121, 1124, and 1127. Such orientation could allow for the properevaporation and ultimate ionization of charged water jet drops 118.

With reference to FIG. 11C, shown is a graph 1102 illustrating thethree-dimensional potential function calculated for an ideal quadrupoletrap where a hypothetical particle is shown as a white circle located atthe null point and the arrows represent the instantaneous unstabledirections. Alternating the polarity of the electrodes shifts theelectric fields in such a way to create a saddle where electric forcesbalance gravitational forces. As a particle begins to fall off a lowpoint of the saddle, the electric fields shift to rotate the saddle totrap the particle. In one embodiment, induced gaseous flow could be themechanism by which to transport ions to the analytical column.

Embodiments of the bubble based ion source may comprise an ion channelconfigured to transport generated ions into any existing MS. A pressuregradient can be utilized similar to existing arrangements with ambientpressure ion sources to introduce the ions to the MS. Electrodynamic ionfunnels or a variation of ion optics can facilitate the transmission ofions through the path of the instrument rather than loss of ions againstinterior surfaces. In one embodiment, a series of annular electrodes ofdecreasing radius can be employed to successfully make the introductionfrom atmospheric pressure into a low pressure environment. In anexperiment conducted where each drop was measured, about 40 ions weredetected in each jet drop 118.

With reference to FIG. 12A, shown is an example embodiment of amultilayer ion channel 1200 using Micro Ion-Optical Systems Technology(MIST) according to various embodiments. The multilayer ion channel 1200can include shaped electrodes 1203 along with orifice arrays for thesampling and transport of ions into separate regions/zones. The shapedelectrodes 1203 can be separated by insulators to generate an electricfield 1206. In some embodiments, the bubble based ion source system 100includes the multilayer ion channel 1200.

The multilayer ion channel 1200 can be configured to transport jet drops118 ions that are levitated and ionized in chamber 112. Element 1209shows equipotential lines from the multilayer ion channel. If theuniform field is employed at element 1212 then the strength is limitedby low pressure breakdown. Element 1215 shows an ion trajectory withinthe multilayer ion channel 1200.

The multilayer ion channel 1200 can include an entrance 1218 thatincludes an aperture with an opening size of “a” as shown. The pressureat the entrance 1218 can be a standard atmospheric pressure, for example750 Torr. The entrance 1218 can be positioned to pull ions from thechamber 112. A vacuum is applied at an exit 1221. The pressure at theexit 1221 can be substantially lower than entrance 1218. As an example,the pressure at the exit 1221 can be 20 Torr.

Jet drops 118 can enter at the entrance 1218 and be pulled into themultilayer ion channel 1200 by one or more of the electric field and aflow through the multilayer ion channel 1200 caused by the pressuredifference. Once the jet drops 118 reach the exit 1221, the energy ofthe jet drops 118 are damped such that a path of the jet drops 118 aredominated by the field lines of the electric field.

A MIST can be used to fabricate ion optical elements for the multilayerion channel 1200. MIST is the convergence offluidic-electrostatic-mechanical functions into an active or passivesystem for ion manipulation and control using controlled, shapedelectric fields and controlled fluidics. The system can be in package(SIP) or system on a chip (SOC). Active systems can dynamically controlfields and flow and contain moving mechanical components. Passivesystems have no moving parts and can be easier to reduce costeffectively. Embodiments of the bubble based ion source that comprisesthe PCB MIST can include adaptive sampling of ions, laminated 3Dsystems, feedback control of ion transmission, integration ofelectronics and large area designs.

In one embodiment, the ion optical elements can be used to increase thefocusing of ions from the atmospheric ion generation zone into the verysmall differential pumping apertures at the interface of separateanalyzer, deposition, or collection system. The divergent ion source ofa bubble ion generation can result in an increase in ion transport intoand away from the ion generating zone by a factor of three to ten.Additionally, an entire integrated ion source with electricalcircuits/components, ion optical elements and fluidics can be made usingPCB/PCBMEMS.

With reference to FIG. 12B, shown is an array of orifices 1201 ofmultilayer ion channels 1200. Each of the orifices 1224 in the array oforifices 1201 can be an entrance 1218 of a different multilayer ionchannel 1200. The array of orifices 1201 can transport a greaterquantity of jet drops 118. As an example, an array of bubble generators103 can each generate multiple bubbles to create jet drops 118 that arelevitated and ionized in chamber 112. In this example, the array oforifices 1201 can facilitate transport of the numerous ionized jet drops118 that are generated.

With reference to FIG. 13, shown is an example schematic of thevertically oriented atmospheric pressure ion sampling ion channel 1300that includes a sampling orifice 1303, ion source 1306, and associatedelectrode 1309. The ion source 1306 can include multiple jet drops 118that expand as they pass toward the electrode 1309. In one embodiment,the jet drops 118 are ions created by ionizing an analyte as describedherein. The electrode 1309 can include an aperture 1312.

With reference to FIG. 14, shown is an example bubble bursting ionsource system schematic 1400 with controls on the environment including,but not limited to, gas flow, solvent flow, field strength, and/or anyother portion of the system that can be controlled. In this way, theupstream options that may be available to the end user can be selectionof gas type, the solvent type, field strength, heating, and flow ratesof bubbled gas or of gas transport. The system will have to be containedto reduce external environmental interference yet limit the influence ofinternal turbulence or ion formation and transport. Multiple bubbles canbe generated as shown in FIG. 14 to create a parallel charged particlesource.

It should be emphasized that the above-described embodiments of thepresent disclosure are merely possible examples of implementations setforth for a clear understanding of the principles of the disclosure.Many variations and modifications can be made to the above-describedembodiment(s) without departing substantially from the spirit andprinciples of the disclosure. All such modifications and variations areintended to be included herein within the scope of this disclosure andprotected by the following claims.

It should be noted that ratios, concentrations, amounts, and othernumerical data can be expressed herein in a range format. It is to beunderstood that such a range format is used for convenience and brevity,and thus, should be interpreted in a flexible manner to include not onlythe numerical values explicitly recited as the limits of the range, butalso to include all the individual numerical values or sub-rangesencompassed within that range as if each numerical value and sub-rangeis explicitly recited. To illustrate, a concentration range of “about0.1% to about 5%” should be interpreted to include not only theexplicitly recited concentration of about 0.1 wt % to about 5 wt %, butalso include individual concentrations (e.g., 1%, 2%, 3%, and 4%) andthe sub-ranges (e.g., 0.5%, 1.1%, 2.2%, 3.3%, and 4.4%) within theindicated range. The term “about” can include traditional roundingaccording to significant figures of numerical values. In addition, thephrase “about ‘x’ to ‘y’” includes “about ‘x’ to about ‘y.’”

Therefore, at least the following is claimed:
 1. A bubble based ionsource system comprising: an ion source configured to generate aplurality of ions comprising: a container at least partially comprisinga solvent; a bubble generator coupled to the container configured togenerate a plurality of bubbles within the solvent; and an ion channelcomprising an aperture and an electrode, the ion channel configured toreceive the plurality of ions through the aperture, the plurality ofions being generated based at least in part on at least a portion of thesolvent from at least one of the plurality of bubbles.
 2. The bubblebased ion source system of claim 1, wherein the electrode is configuredto facilitate guiding the plurality of ions to an analyzer device. 3.The bubble based ion source system of claim 2, wherein the analyzerdevice is at least one of: an ion mobility spectrometer, a massspectrometer, a charged particle deposition system, or a charge energygeneration device.
 4. The bubble based ion source system of claim 1,wherein at least one voltage applied to the ion channel facilitatesmoving the plurality of ions into an analyzer device.
 5. The bubblebased ion source system of claim 1, further comprising a heat sourcepositioned above the container, wherein the plurality of ions aregenerated further based at least in part on the heat source.
 6. Thebubble based ion source system of claim 1, wherein the bubble generatoris configured to generate the plurality of bubbles within the solvent byinjecting air into the solvent.
 7. An atmospheric ion source generatorcomprising: a container at least partially enclosing a solvent; a bubblegenerator configured to generate a plurality of bubbles within thesolvent, the plurality of bubbles move to a surface of the solvent whengenerated; and an ion channel configured to receive a plurality of ions,the plurality of ions being generated based at least in part on at leasta portion of the solvent from at least one of the plurality of bubbles.8. The atmospheric ion source generator of claim 7, wherein theplurality of ions are drawn through a plurality of apertures in an arrayof ion channels.
 9. The atmospheric ion source generator of claim 8,wherein the array of ion channels comprises the ion channel.
 10. Theatmospheric ion source generator of claim 7, wherein each of the bubblesburst in a form of a jet drop, and at least a portion of the jet drop isreceived through an aperture.
 11. The atmospheric ion source generatorof claim 7, wherein the ion channel comprises an electrode that appliesa voltage to the ion channel that facilitates keeping the plurality ofions stabilized within the ion channel without touching walls of the ionchannel.
 12. The atmospheric ion source generator of claim 7, whereinthe ion channel comprises a button electrode levitation chamber tofacilitate keeping the plurality of ions stabilized within the ionchannel without touching walls of the ion channel.
 13. The atmosphericion source generator of claim 7, wherein the ion channel comprises aplurality of planes to facilitate translation of the plurality of ionshorizontally.
 14. A method of generating ions comprising: generating,via a bubble generator, a plurality of bubbles in a solvent, theplurality of bubbles rising to a surface of the solvent; and receiving,via an ion channel, a plurality of ions through an aperture, theplurality of ions being generated based at least in part on at least aportion of the solvent from at least one of the plurality of bubbles.15. The method of generating ions of claim 14, guiding the plurality ofions to an analyzer device based at least in part on a voltage appliedto the ion channel.
 16. The method of generating ions of claim 15,wherein the voltage is based at least in part on a configuration of theion channel and a desired field strength.
 17. The method of generatingions of claim 16, further comprising applying a second voltage to one ofa plurality of layers of the ion channel, wherein the voltage is appliedto another one of the plurality of layers of the ion channel.
 18. Themethod of generating ions of claim 16, wherein the plurality of ions areguided to the analyzer device based at least in part on a plurality ofvoltages applied to a plurality of layers of the ion channel, whereinthe voltage is one of the plurality of voltages and the voltage isapplied to one of the plurality of layers of the ion channel.
 19. Themethod of generating ions of claim 14, generating the plurality of ionsby evaporating the at least a portion of the solvent from the at leastone of the plurality of bubbles.
 20. The method of generating ions ofclaim 14, wherein each of the bubbles burst at the surface of thesolvent in a form of a jet drop which is received through the apertureof the ion channel.